This manual may contain references to HP or Hewlett-Packard. Please note that Hewlett-. Packard’s former test and measurement, semiconductor products and. A. • Test frequencies – 10 kHz to 10 MHz. • Test signal level – 1 mV to 1 V rms. • % basic AUTO MANUAL DOWN UP. SELF. TEST The A operates over a frequency range of Hz to kHz ually or under HP-IB control. The HP A and HP A Multi-frequency LCR Meters, microprocessor- based impedance . Trigger: internal, external or manual. Measurement terminals.
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DC Bias Connector Guard terminal is sometimes used in high impedance measurement. A digital offset adjustment function measures residual capacitance, inductance and resistance in- herent to the test fixture used, and offsets the effects of these parasitic impedances to zero with respect to the measured values. Installation Instructions The interface capability of a device connected to the HP-IB is specified by the interface functions built into the device.
Measurement parameter formulas for measurement functions are given in Table Four terminal pair configuration high and low terminals for current and potential terminals with guard terminal. Ranging operation has actuated unuseable range. The figure shows sample circuitry appropriate to A appli- cations.
Kit Part Number Fuse: Hewlett-Packard uses a two-section nine character serial number which is marked on the serial number plate Figure attached to the instrument rear panel.
Wrap instrument in heavy paper or plastic. If the STORE button is not pressed, the memory mode operation is automatically deactivated after an elapse of five seconds display continues flashing and the instrument resumes normal measurements.
4275A LCR METER
Manual ranging is also feasible. Other functions and performance is the same as those of the standard instrument for accuracies at the optional frequencies, refer to specifications in Section I.
Set A controls according to Gen- eral Component Measurement procedure Figure steps 7 through Read displayed capacitance value. This automatically sets the instrument to C-G measurement mode.
Index of /~kurt/manuals/manuals/HP Agilent
The remote program code “K” can be used to recognize the status of key settings. This setting status will again be enabled instead of standard initial control settings when 4275z instrument is turned on.
While monitoring the values on the display, the test signal level and test frequency may be chosen so that these values can be set near those of the normal operating conditions of the device under test. Test Signal Level Monitor Accuracy Effect of Resonance In Sample The HP Model Up can be operated on the bench or in a rack mount.
Figure shows the instrument and supplied accessories.
A LCR METER [Obsolete] | Keysight (formerly Agilent’s Electronic Measurement)
This operability both helps to up-grade the quali- ty of product design and speeds physical and chem- ical research of material investigations creating a new measurement capability in these and other scientific fields.
If assistance is needed for se- lecting the correct power cable, contact nearest Hewlett-Packard office, Proceed to step 3 described below. For semiconductor measurements, the special care needed for making reli- able measurement is described in Figure Dissipation Factor Equations DISPLAY B gives subordinate measurement data such as dissipation factor, quality factor, equivalent series resistance or conductance in inductance or capacitance measurements; reactance, susceptance inductance or capacitance in resistance measurements; or the phase angle in impedance measurements.
When a different measurement is to be at- tempted, press appropriate pushbuttons and select desired functions. L deviation and percent deviation for C, L, R, z! Carriage return Line feed g g Refer to paragraph Most significant- ly, the A can be of particular help in the experimental assessment of devices in the semiconductor testing field. When dissipation factor of a very low loss sample is measured, a negative value within allowable measurement error limits such as, for example, Preparation for Use When a component having a low value is meas- ured, the measured value becomes the sum of the sample value and the resi- dual parameter values.
These pushbuttons se- lect desired measurement circuit mode to be used for taking a measurement. Measurement Ranges and Number of Display Digits sheet 5 of 5. In the numeric displays, lesser significant digit data is represented by a small zero o figure to differentiate it from a significant figure which is represented by a large zero Note Less significant digit data identi- fy the meaningless numbers related to the uncertainty of the measure- ment result.
The German Bundespost has been notified that this equipment was put into circulation and was granted the right to check the product type for compliance with these requirements.