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In all cases, the cutoff must be specified on drawings created or revised after this Standard is published. Changes of height as small as 1 nm or less can be identified.
Changes in stylus condition may be checked by several methods discussed in Section The direct result of this filtering process is a smoothed profile,that is, one whose short wavelengths are attenuated. Llght source Specular and diffuse reflectance detectors C2. Other b46.11 of engineering components such as dimensional and geometrical characteristics, material, metallurgy, and stress must also be controlled.
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For waviness, one half of a waviness long-wavelength cutoff is required at b46.1 of the waviness evaluation length for filtering. This eliminates the potential for aliasing.
Circular Path Profiler The circular path profiler developed by Sommargren para. The measured stylus displacements yield the measured surface profile. Roughness comparison specimens are used to guide design personnel with respect to the feel and appearance of a surface of known roughness grade produced by a selected process. For example, one could obtain the ARq for roughness by calculating a filtered, wavy mean surface with respect to which the heights Z ,x,s are calculated.
If this new cutoff length and R, combination do not conform to Tablethen the cutoff length determined in d above should be used. Does one just specify what grit to use for the final pass?
Profiling Contact Skidless Instruments 2. The calibrated step height is shown as the disA tance d in Fig.
What is Surface Texture B46.1 for Stainless
However, instruments exist that do not clearly fit within any single instrument class. The fringes are of exceptionally high contrast because the workpiece is acting as its own reference mirror which, of course, has the same reflectivity.
This Section divides area profiling techniques into two classes, i. Holzhauer, The Timken Co. V The purpose of this Section is to foster the uniformity of surface roughness evaluation among contact, skidded instruments and to allow the specification of desired surface texture values with assurance of aame repeatable results.
If control is required at more than one station, pilot specimens may be cut into the required number of pieces. The cone-shaped stylus with a nominally spherical tip shall be considered standard unless otherwise specified.
For h46.1, see Table Area profiling instruments may be used to measure AR, and AR, provided the lateral resolution andthe sampling length or alternatively, the sampling area are indicated for each measurement.
I Itis determined by subtracting the mean line from the measured profile.
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The ase nm and the angstrom unit A are also used in someindustries. When an electrical or digital filter is used, the roughness long-wavelength cutoff value determines and is equal to the roughness sampling length, i. Wsme instrument nonlinearity is the deviation in measured z axis displacement as a function of the actual z axis stylus displacement. No part of this publication may be copied or reproduced in any form, electronic retrieval system or otherwise, without the prior written permission of the American National Standards Institute, 11 West 42nd Street, New York, N Ywhich azme reproduction rights in the United States.
The further separation of form error from waviness may be accomplished by least squares methods as mentioned in para. Contact, skidded instruments and procedures used to determine roughness values of a given surface shall comply with the specifications in this Section. For spatial wavelengths greater than the cutoff or sampling length, the effective attenuation rates of the three procedures differ.
As long as the curvature of the step edges does not extend out to the offset distance W, the offset should be as small as possible to improve 65 precision of the height measurement.
Grooves having an isosceles triangle profile see Fig. Nominal Wsme of R, for Type C This is determined by such characteristics of the measuring instrument as the sampling interval defined below ase, radius of the stylus tip, or optical probe size.